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Active Power Cycling for End of Life Tests of Heavy Wire Bond Interfaces on Power Semiconductors

Title:
Active Power Cycling for End of Life Tests of Heavy Wire Bond Interfaces on Power Semiconductors
Year:
2010
Publication type:
Conference contribution
Conference:
PCIM Europe 2010
Book title:
Proceedings / PCIM Europe 2010 : International Exhibition & Conference for Power Electronics Intelligent Motion Power Quality
Publisher:
Berlin ; Offenbach: VDE-Verl.
ISBN:
978-3-8007-3229-6
Pages:
k.A.
Language:
English
Document status:
Published
PubListerURL:
https://publister.bib.th-wildau.de/publister/public/publication/2187
Göhre, J., Schneider-Ramelow, M., Geißler, U., & Lang, K. (2010). Active Power Cycling for End of Life Tests of Heavy Wire Bond Interfaces on Power Semiconductors Proceedings / PCIM Europe 2010 : International Exhibition & Conference for Power Electronics Intelligent Motion Power Quality (pp. k.A.). Berlin ; Offenbach: VDE-Verl..
@inproceedings{2187,
    author           = {Göhre, Jens and Schneider-Ramelow, Martin and Geißler, Ute and Lang, Klaus-Dieter},
    title            = {Active Power Cycling for End of Life Tests of Heavy Wire Bond Interfaces on Power Semiconductors},
    year             = {2010},
    pages            = {k.A.},
    publisher        = {VDE-Verl.},
    address          = {Berlin ; Offenbach},
    isbn             = {978-3-8007-3229-6},
    booktitle        = {Proceedings / PCIM Europe 2010 : International Exhibition & Conference for Power Electronics Intelligent Motion Power Quality},
}


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